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Nikon’s High Content NIS-Elements Package
Total acquisition-to-analysis solution for high-content imaging applications. Seamless workflow from microscope and peripheral device control to data analysis and management.
Speed and Flexibility
Streamlines high-speed, automated well-plate acquisition, data review, analysis and management of multiple well plate experiments.
NIS-Elements HC interface simplifies experiment setup using wizards. Easily define acquisition parameters including well-plate configuration, plate handling, autofocusing, filter switching and detectors.
Realtime viewing of data acquisition and analysis progress for instant inspection. Multiple analysis assays can be run simultaneously during the imaging phase or run post-acquisition on offline stations.
Heat Maps of well plates, sample images, binary masks, assay results, sample labels and other metadata are centralized for quick filtering, gating and drill down to cellular detail.
Create graphs instantly for data review. Classify, filter, tile, label data points from several different graph types. NIS-Elements offers histogram, scatterplot, bar chart, XY line, classification and gating functions. Easily navigate within the Plate View and export to Excel or bitmap.