Nikon Instruments Inc. | Americas
- en Change Region
- Global Site
| STEDYCON | |
|---|---|
| 2D STED Resolution |
< 40nm, Typically 30nm |
| STED System Design |
Patented Easy-STED Instrument design. Alignment Free. |
| Excitation Lines |
405 nm (UV, CW,), 488 nm, 561nm, 640nm (all pulsed) |
| STED Lines |
775nm (pulsed) |
| Detection |
3 Time Gated APDs, 650-700nm; 575-625nm; 505-545nm; DAPI detection |
| STED Channels |
2 STED channels at 561 and 640 |
| QUAD beam scanner |
90um x 80um (@100x); 512x512 up to 1.1FPS; line frequency up to 800Hz |
| Pinhole |
Motorized with 12 different sizes |
| Software |
Browser based control software |
| Dimensions |
Scan head: 11cm x 20cm x 20cm; Controller: 22cm x 55cm x 60cm; Weight: <40kg |
| Microscope Compatibility |
Inverted Ti2-E left or right port, upright Ni-E front port, upright FN1 front port |
