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Center of Excellence
UMass Amherst’s Nikon Center of Excellence was established as part of a broad initiative to provide new and advanced research infrastructure to the local academic and non-academic community. The mission of our NCoE is to provide trainees with in-depth knowledge of advanced microscopy techniques and training for the academic and biotechnology workforce. Additionally, we provide opportunities to connect with industry professionals from Nikon and other partners.
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This fast spinning disk confocal system is configured on a Ti-E inverted microscope and features a galvo-based stimulation system for FRAP and other photostimulation applications.
Yokogawa CSU-X1 spinning disk confocal
NIS-Elements software
This Ti-E inverted microscope is equipped with an Arcturus micro-dissection system for applications requiring laser ablation.
This multimodal system includes both TIRF and an A1R resonant scanning confocal system and supports a range of applications, including FRET.
NIS-Elements software
This A1si point scanning confocal system additionally features a FLIM module from Becker & Hickl for fluorescence lifetime imaging.
LUN-4 4-line laser unit (405 nm, 488 nm, 561 nm, 640 nm)
NIS-Elements software
This A1R MP resonant scanning multiphoton system is configured on an FN1 upright microscope to accommodate large samples.
ECLIPSE FN1 upright microscope
LUN-4 4-line laser unit (405 nm, 488 nm, 561 nm, 640 nm)
NIS-Elements software
This high content analysis systems is configured with Ti-E inverted microscope, spinning disk confocal scanner, and a robotic plate loader for automated exchange of multiple wellplates.
NIS-Elements software
This super-resolution N-STORM system is made for 3D single molecule localization as well as TIRF imaging.
N-STORM super-resolution single molecule localization microscopy system
LUN-V 4-line laser unit (405 nm, 488 nm, 561 nm, 647 nm)
NIS-Elements software
This versatile microscope system features both the A1R resonant scanning confocal and N-SIM E super-resolution structured illumination system, allowing users to optimzie for speed or resolution and with standard sample preparations.
N-SIM E super-resolution structured illumination microscopy system
NIS-Elements software
Three offline image analysis workstations with Nikon's NIS-Elements software. NIS-Elements combines automated intelligence to microscopes, cameras, components and peripherals with powerful archiving, analysis, visualization and archiving tools. Its intuitive interface simplifies workflow and speeds up image acquisition times while providing powerful features such as image stitching, object counting and volume views.