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ECLIPSE Ji

Smart Imaging System

The Open Architecture Digital Inverted Microscope

The ECLIPSE Ji (Ji) is Nikon’s first all-digital research grade inverted microscope. With no eyepieces, this microscope is designed to be easy to learn and use, while maintaining the optimum optical quality and large field of view (FOV) Nikon microscopes are well-known for.

Additionally, Nikon’s 4th generation perfect focus system (PFS) is integrated into Ji for reliable long-term observation of specimens.

Ji’s integrated enclosure means users can navigate their samples in brightly-lit environments or even remotely, using the embedded scientific grade CMOS detector, or use any number of other possible detector options, depending on the research application.

Download ECLIPSE Ji (for Assays) (4MB)

Download ECLIPSE Ji (for Research) (3.58MB)

ECLIPSE Ji configured with AX-NSPARC confocal system


Key Features

Digital Microscope / Wide Choice of Optics

Ji is compatible with a wide variety of Nikon research objective lenses, including immersion objective lenses (water, silicon, and oil), making the microscope flexibly configurable for a variety of research applications.

Real time focus correction with Perfect Focus System

The Perfect Focus System (PFS) automatically corrects focus drift caused by temperature changes and mechanical vibrations, which can be generated by a variety of factors including the addition of reagents to the sample or multi-position imaging.

The PFS maintains focus by detecting and tracking the position of the cover slip surface in real time. Unique optical offset technology allows users to maintain focus at a desired position offset from the cover slip surface. The PFS automatically and continuously maintains focus by means of a built-in linear encoder and high speed feedback mechanism, providing highly reliable images even during long-term, complex imaging tasks.

Neutrophil flowing in blood vessel (time-lapse)

Images courtesy of: Professor Masaru Ishii, Department of Immunology and Cell Biology, Graduate School of Medicine, Osaka University

25 mm Imaging Port Enabling Large View of the Sample

Danio sp. 2d+ embryo 4X

Ji offers a 25 mm field of view (FOV) capturing 2X more data in a single image compared to previous technology. The large FOV provides incredibly flat images from edge-to-edge, even with large formats sCMOS cameras, enabling users to extract quantitative data from the entire image.

Enhanced Navigation and Detection Using AI Tools

Innovative AI-driven tools for sample navigation make it simple to find samples, set the appropriate wavelengths, exposure time and illumination power, and locate areas of interest without the need for eyepieces. Time on the microscope should be spent running experiments, not struggling with finding the sample, adjusting parameters, and navigation.

Automatic detection of plate type and virtual display for navigation

Experiment setups quickly optimize the illumination and filter settings, while simplifying the user interface to focus on the experiment.

Ideal for Automated Imaging and Analysis

ECLIPSE Ji configured with Yokogawa CSU-W1 Spinning Disk

Ji is designed to be more simple to operate: tools to assist in focus, wavelength selection, as well as imaging tools such as shading correction, and focus offsets are built-in. Optional tools such as deconvolution are easily integrated.

Because Ji can be the platform for a large number of possible detectors, there is an extensive toolbox of analysis and processing tools available.

Built-in Expandability

Ji is designed to easily integrate additional imaging tools as research needs develop over time, including environmental chambers, automatic objective immersion devices, piezo-electric fast focus drives, and more.

Notice: The CREST option is available in limited regions. Please contact your local Nikon dealer for information on this optional product in your country.

The Base for a Variety of Detector Options

Ji includes an embedded monochrome CMOS detector by default, and additional detectors can be easily integrated into the stand depending on the application needs. Point and field scanning confocal systems, super-resolution systems, and other scientific grade detectors can easily be fitted to a 25 mm FOV optical port.

ECLIPSE Ji Assay Microscope

Ji base architecture is also available as a turnkey assay benchtop microscope, with predefined user-friendly automated plate scanning assays and data-rich output.

*The design and specifications may differ from the actual product.