The Open Architecture Digital Inverted Microscope
The ECLIPSE Ji (Ji) is Nikon’s first all-digital research grade inverted microscope. With no eyepieces, this microscope is designed to be easy to learn and use, while maintaining the optimum optical quality and large field of view (FOV) Nikon microscopes are well-known for.
Additionally, Nikon’s 4th generation perfect focus system (PFS) is integrated into Ji for reliable long-term observation of specimens.
Ji’s integrated enclosure means users can navigate their samples in bright outside environments or even remotely, using the embedded scientific grade CMOS detector, or use any number of other possible detector options, depending on the research application.
ECLIPSE Ji configured with AX-NSPARC confocal system
Key Features
Digital Microscope / Wide Choice of Optics
Ji is compatible with a wide variety of Nikon research objective lenses, including immersion objective lenses (water, silicon, and oil), making the microscope flexibly configurable for a variety of research applications.
Real time focus correction with Perfect Focus System
The Perfect Focus System (PFS) automatically corrects focus drift caused by temperature changes and mechanical vibrations, which can be generated by a variety of factors including the addition of reagents to the sample or multi-position imaging.
The PFS maintains focus by detecting and tracking the position of the cover slip surface in real time. Unique optical offset technology allows users to easily maintain focus at a desired position offset from the cover slip surface. The PFS automatically and continuously maintains focus by means of a built-in linear encoder and high speed feedback mechanism, providing highly reliable images even during long-term, complex imaging tasks.
Neutrophil flowing in blood vessel (time-lapse)
Images courtesy of: Professor Masaru Ishii, Department of Immunology and Cell Biology, Graduate School of Medicine, Osaka University
25 mm Imaging Port Enabling Large View of the Sample
Danio sp. 2d+ embryo 4X
Ji offers a 25 mm field of view (FOV) capturing 2X more data in a single image compared to previous technology. The large FOV provides incredibly flat images from edge-to-edge, even with large formats sCMOS cameras, enabling users to extract quantitative data from the entire image.
Enhanced Navigation and Detection Using AI Tools
Automatic detection of plate type and virtual display for navigation
Ideal for Automated Imaging and Analysis
ECLIPSE Ji configured with AX confocal
Ji is designed to be more simple to operate: tools to assist in focus, wavelength selection, as well as imaging tools such as shading correction, and focus offsets are built-in. Optional tools such as deconvolution are easily integrated.
Because Ji can be the platform for a large number of possible detectors, there is an extensive toolbox of analysis and processing tools available.
Built-in Expandability
Ji is designed to easily integrate additional imaging tools as research needs develop over time, including environmental chambers, automatic objective immersion devices, piezo-electric fast focus drives, and more.
The Base for a Variety of Detector Options
Ji includes an embedded monochrome CMOS detector standard, and additional detectors can be easily integrated into the stand depending on the application needs. Point scanning confocal systems, and other scientific grade detectors can easily be integrated into a 25 mm FOV optical port.
ECLIPSE Ji Assay Microscope
Ji base architecture is also available as a turnkey assay benchtop microscope, with predefined user-friendly automated plate scanning assays and data-rich output.
*The design and specifications may differ from the actual product.
Product Brochure
Digital Microscopes
- ECLIPSE Ji
- ECLIPSE Ui