News
Nikon Delivers True Spectral Imaging With DIGITAL ECLIPSE C1si
Dec 6, 2004
Nikon Instruments today announced an exciting new Spectral Imaging technology combining the strength of conventional imaging with that of spectroscopy to accomplish tasks that separately each can not perform. The new DIGITAL ECLIPSE C1si, a confocal laser fluorescence microscope system…
Nikon Delivers True Spectral Imaging With DIGITAL ECLIPSE C1si
Dec 6, 2004
Nikon Instruments today announced an exciting new Spectral Imaging technology combining the strength of conventional imaging with that of spectroscopy to accomplish tasks that separately each can not perform. The new DIGITAL ECLIPSE C1si, a confocal laser fluorescence microscope system…
Nikon Announces LiveScan Next Generation Swept Field Confocal Microscope
Dec 6, 2004
Nikon Instruments today announced the next generation of confocal microscopy, the Nikon LiveScan Swept Field Confocal Microscope (SFC). This new laser confocal microscope enables dynamic live cell confocal imaging. Its revolutionary new optical design is used in point scan mode…
Nikon Announces Two New Illumination Systems with Superior Performance for TIRF And High S/N Fluorescence
Oct 25, 2004
Nikon Instruments Inc., a leader in advanced optical microscopy, today announced the addition of two new state-of-the-art illumination systems to its family of high quality imaging products. The Nikon White Light Total Internal Reflection Fluorescence (TIRF) illuminator is a cost…
Nikon Announces the CFI Plan Achromat 100x Water Dipping Lens, Providing Superior Performance for Patch Clamp Physiology and Multi-Photon Imaging
Oct 25, 2004
Nikon Instruments Inc., a leader in the development of advanced optical microscopy, today announced a leap in optical technology with the addition of the new CFI Plan Achromat 100X Water Dipping lens to their line of optics for advanced biomedical…
Nikon Instruments Announces Record Sales of Its NRM-3100 Overlay Inspection Measurement System
Oct 11, 2004
Nikon's Semiconductor Inspection Technologies Group (SITECH) today announced that a major US semiconductor manufacturer has placed a multi-million dollar order for Nikon's NRM-3100 Overlay Inspection Measurement system. The sale marks an important milestone in SITECH's move into global 300mm semiconductor…
Nanotechnology Makes a Small World Even Smaller
Oct 6, 2004
The winning image of the 30th Annual Nikon International Small World Competition represents a range of new possibilities using nanotechnolgy to transform our physical world in ways never before imagined. Out of 1,200 images submitted from around the globe, only…
Nikon Introduces COOLSCOPE VS
Aug 16, 2004
Nikon Instruments Inc., a world leader in the development of advanced optical technology, introduced COOLSCOPE VS today, the next generation of its COOLSCOPE digital microscope featuring an integrated software suite for virtual microscopy developed by Bacus Laboratories Inc. The COOLSCOPE…
R&D Magazine Awards Nikon Instruments' COOLSCOPE Top 100 New Product of the Year
Aug 2, 2004
Nikon Instruments, Inc., a world leader in the development of advanced optical technology, today announced that R&D Magazine, a preeminent publication serving applied research and development, university, non-profit and government professionals, has chosen COOLSCOPE, a fully automated, web-enabled microscopy imaging…
Nikon Announces Digital Eclipse C1-Plus - A New Generation of Confocal Microscope Systems
Jul 20, 2004
Nikon Instruments today announced the Digital Eclipse C1-Plus Modular Confocal System. A new generation of confocal microscope systems designed with improved scan head optics to boost optical performance to 400nm. The C1-Plus also includes faster image acquisition with bi-directional scanning…