confocal microscopy
Scanned illumination with a fine pattern (e.g., diffraction-limited point) and detection through an aperture mask matching the illumination pattern in a conjugate field plane, which rejects out-of-focus light.
Scanned illumination with a fine pattern (e.g., diffraction-limited point) and detection through an aperture mask matching the illumination pattern in a conjugate field plane, which rejects out-of-focus light.