N-SIM E
Système de microscope à super résolution
Suspendu
Caractéristiques
| N-SIM E | |
|---|---|
| Lateral resolution (FWHM of beads in xy) | 115 nm*1 in 3D-SIM mode |
| Axial resolution (FWHM of beads in z) | 269 nm*1 in 3D-SIM mode |
| Image acquisition time | Up to 1 sec/frame (3D-SIM) |
| Imaging mode | 3D-SIM (Reconstruction method: slice, stack) |
| Multi-color imaging | Up to 3 colors |
| Compatible laser | LU-NV series laser unit 488 nm, 561 nm, 640 nm |
| Compatible microscope | Motorized inverted microscope ECLIPSE Ti2-E
Perfect Focus System |
| Objective | CFI SR HP Apochromat TIRF 100XC Oil (NA 1.49) CFI SR HP Apochromat TIRF 100XAC Oil (NA 1.49) CFI SR Plan Apochromat IR 60XC WI (NA 1.27) CFI SR Plan Apochromat IR 60XAC WI (NA 1.27) CFI Plan Apochromat Lambda 60XC (NA 0.95)*2 CFI Plan Apochromat Lambda D 40XC (NA 0.95)*2 |
| Camera | ORCA-Fusion BT sCMOS camera (Hamamatsu Photonics K.K.) |
| Software | NIS-Elements AR NIS-Elements C (for Confocal Microscope) Both require additional software modules NIS-A 6D and N-SIM Analysis |
| Operating conditions | 20 ℃ to 28 ℃ (± 1.5 ℃) |
*1 These values are measured using 100 nm diameter beads excited by a 488 nm laser. Actual resolution is dependent on laser wavelength and optical configuration.
*2 Supports slice reconstruction.
Brochure de produit
