AX R MP
Sistema microscopico multifotone
Software Powered by Artificial Intelligence
Powerful software that goes deeper
From routine daily use to the most complex multiphoton experiments, NIS-Elements C can manage it all. Build custom multi-step acquisitions, automate processing and create unique analysis routines, all in one easy-to-use software platform.
AI software innovations designed to assist
The optional software module NIS.ai is equipped with image processing tools and customization functions. Utilizing deep learning and AI technology, it automates image acquisition and generation of optimal images for analysis. With NIS.ai, users can build in tailor-made solutions for acquisition, visualization and analysis customized for specific experiments.
Denoise.ai, a standard module in the NIS-Elements C software, automatically clarifies high speed confocal images by removing speckle. Since signal collection is short when imaging quickly, noise can significantly impact image quality. Using AI to recognize speckle within these images, allows NIS-Elements to remove it, increasing data quality, simplifying analysis and minimizing cellular damage, all while maintaining maximum speeds.
Equipped with auto shading correction function as standard
Vignette removal data for each microscope and objective is already built into the NIS-Elements C control software. Images with uniform brightness can be automatically generated up to the periphery of the field of view with one click.
Unmix wavelength crosstalk
When there is significant crosstalk between multiple wavelengths excited by one wavelength, fluorescent separation (unmixing) allows clear separation of dyes.
Flat field of view
Nikon's core strength is optical design. This requires that all aspects of our objectives and systems be mathematically calculated. With this information, NIS-Elements can predict “vignetting” or "shading" across a given field and correct for it automatically. With the click of a button, new “AX Shading Correction" provides flat images across maximized fields of view.
Seamlessly stitched images
When a sample is too large for a single field of view, stitching is the tool of choice. With ”AX Shading Correction,“ flat images generate seamlessly stitched data; reducing or eliminating common lines and artifacts.
Capture high-resolution images with a single click
NIS-Elements C-ER generates super-resolution images with an XY resolution of 120 nm* by automatically determining the optimal image process parameter from acquired images.
* For confocal imaging.