High Content Analysis option
Total acquisition-to-analysis solution for high-content imaging applications. Seamless workflow from microscope and peripheral device control to data analysis and management.
주요 특징들
Speed and Flexibility
Streamlines high-speed, automated well-plate acquisition, data review, analysis and management of multiple well plate experiments.
NIS-Elements HC interface simplifies experiment setup using wizards. Easily define acquisition parameters including well-plate configuration, plate handling, autofocusing, filter switching and detectors.
① Define general job parameters
• Z-stack
• Sample labelling
• Autofocus
• Sending task completion by e-mail or SNS
② Define optical configurations for image capture
③ Well plate setting
• Define well plate to use
• Select well plate for image capture
• Define XY image capture pattern inside a well
• Sample labelling
④ Define analysis
Review
Real-time viewing of data acquisition and analysis progress displays for instant inspection. Multiple analysis assays can be run simultaneously during the imaging phase or run post-acquisition on offline stations.
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