Noticias
Nikon Introduces Inverted Materials Microscope, Eclipse MA200
sept 10, 2008
Nikon Instruments, Inc. introduces the Eclipse MA200, an inverted materials microscope with an innovative design that has been optimized for digital imaging and ergonomic efficiency. The MA200 uses integrated intelligence to automatically combine captured images with data on their observation…
New Digital CAD Overlay Brings Easy Visualization to Nikon's iNexiv VMA Automeasure Software
sept 8, 2008
Nikon Instruments, Inc. added a new feature to its iNexiv VMA Automeasure software, the new Digital CAD Overlay, which allows users to easily compare an actual part to its CAD design specification. Eliminating the need for custom overlays or the…
Nikon's New Wafer Loader NWL200 Series Is the First Ever Capable of Loading Wafers as Thin as 100 Micrometers
jul 15, 2008
Accommodating a changing semiconductor manufacturing process where wafers continue to grow thinner, Nikon Instruments Inc., announced its new wafer loader NWL200 Series, the first line-up of wafer loaders capable of loading wafers as thin as 100 micrometers. Using a new…
Nikon's New APM-3000 Series Fills Gap Between CD SEM and OCD Semiconductor Inspection Devices
jul 15, 2008
As the advanced IC device process continues to shrink, monitoring pattern profiles has become so critical that Nikon Instruments Inc. launched the APM-3000 Series, an automated pattern profile inspection device that fills the gap between micro and macro semiconductor inspection…
Nikon's New WES-3000 Wafer Edge Inspection Tool Offers High-Throughput, In-Line Inspection With High-Resolution
jul 15, 2008
Nikon Instruments Inc. announced its new WES-3000 Wafer Edge Inspection Tool, designed to identify defects often experienced with immersion lithography as well as other IC manufacturing processes. The WES-3000 incorporates high-throughput, in-line inspection with a review station featuring high-resolution and…
Nikon Instruments Introduces New Microscopes and Illumination Stand for Education and OEM Markets
jul 15, 2008
Nikon Instruments Inc. announced its new SMZ-445/460 stereoscopic zoom microscopes, combining a very small size with high performance at a low cost for the Industrial and OEM markets. These microscopes allow observation of a wide range of applications, from routine…
Nikon Instruments Introduces LV-DAF for Full System Integration with Eclipse LV Microscope Series
jul 15, 2008
Nikon Instruments Inc. announced its new Dynamic Auto-Focus unit, the LV-DAF, bringing fast, versatile auto-focus to the Eclipse LV semiconductor inspection microscope series and OEM applications. Featuring the newly developed Hybrid Auto-Focus system, the LV-DAF offers a large focus range…
Nikon Instruments Opens New Imaging Center at Northwestern University
jun 4, 2008
Nikon Instruments Inc. and Northwestern University's Feinberg School of Medicine announced the opening of a collaborative core microscopy imaging center, establishing a partnership that brings improved research capabilities to Northwestern, while providing critical feedback for Nikon product development. One of…
Nikon Instruments Receives Record Number of Entries for Nikon Small World
may 27, 2008
Nikon Instruments Inc. announced that it received a record number of entries for the 2008 Small World Photomicrography Competition, shattering the previous record by over 300 images. The oldest and most respected competition of its kind, Nikon Small World celebrates…
Nikon Instruments Begins Direct Sales and Technical Support in Southern California and Rocky Mountain Territories
may 7, 2008
Nikon Instruments, Inc. is pleased to announce that it has begun direct sales and technical support for Nikon's BioScience Microscopes, Confocal Systems and Digital Imaging products, along with Industrial products including Industrial Microscopes, Measuring and Vision Systems, in the Southern…