Dispersion staining (DS) microscopy refers to a family of analytical optical staining methods used to help determine the identity of unknown microscopic materials. The dispersive properties of the unknown material can be probed when immersed in a material with known dispersion curve. Color (wavelength) is then used as readout of differences in dispersive properties. DS microscopy is commonly applied in testing for the presence of asbestos in construction materials.
Nikon offers both center stop-type DS (C-DS) and phase-type DS (R-DS) objectives to better meet customer needs. C-DS center stop objectives feature a stop in the center of an aperture plane, blocking light that is not heavily refracted. R-DS phase contrast objectives for dispersion staining are similar, but the phase plate blocks the waveband where the refractive indices of the two materials are similar.
| Model | Dimensions | Transmittance | NA | W.D. (mm) | Cover glass thickness (mm) | Correction ring | Observation |
|---|---|---|---|---|---|---|---|
| CFI R-DS 10X | Diagram | Graph | 0.25 | 7.00 | 0.17 | PH | |
| CFI Plan Fluor R-DS 40X | Diagram | Graph | 0.75 | 0.66 | 0.17 | PH | |
| CFI Plan Fluor BM 40X | Diagram | Graph | 0.75 | 0.66 | 0.17 | BF, DF (Dry/Oil), PH, FL (visible light, UV) |
BF: Brightfield
DF: Darkfield
PH: Phase contrast
FL: Fluorescence
