Sistema de microscopio de súper resolución

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Especificaciones

N-SIM-E
Lateral resolution (FWHM of beads in xy) 115 nm*1 in 3D-SIM mode, 86 nm*2 in TIRF-SIM mode
Axial resolution (FWHM of beads in z) 269 nm*1 in 3D-SIM mode
Image acquisition time Up to 1 sec/frame (3D-SIM)
Imaging mode 3D-SIM (Reconstruction method: slice, stack)
Multi-color imaging Up to 3 colors
Compatible laser LU-NV series laser unit
488 nm, 561 nm, 640 nm
Compatible microscope Motorized inverted microscope ECLIPSE Ti2-E

Perfect Focus System
Motorized XY stage with encoders
Motorized barrier filter wheel
Piezo Z stage
Objective CFI SR HP Apochromat TIRF 100XC Oil (NA 1.49)
CFI SR HP Apochromat TIRF 100XAC Oil (NA 1.49)
CFI SR Plan Apochromat IR 60XC WI (NA 1.27)
CFI SR Plan Apochromat IR 60XAC WI (NA 1.27)
CFI Plan Apochromat Lambda 60XC (NA 0.95)*2
CFI Plan Apochromat Lambda 40XC (NA 0.95)*2
Camera ORCA-Flash 4.0 sCMOS camera (Hamamatsu Photonics K.K.)
Software NIS-Elements Ar
NIS-Elements C (for Confocal Microscope A1+/A1R+)
Both require additional software modules NIS-A 6D and N-SIM Analysis
Operating conditions 20 ℃ to 28 ℃ (± 1.5 ℃)

*1 These values are measured using 100 nm diameter beads excited by a 488 nm laser. Actual resolution is dependent on laser wavelength and optical configuration.

*2 Supports slice reconstruction.