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Benchtop Scanning Electron Microscope

A powerful yet economic benchtop scanning electron microscope from Nikon and JEOL.

The latest in benchtop SEM technology, the JCM-6000Plus "NeoScope™" is a touch panel controlled, multifunctional desktop scanning microscope that answers the increasingly diversified needs among users worldwide. The JCM-6000Plus is equipped with the high-sensitivity semiconductor detectors found in high-end instruments, making it easy to acquire contrast information about specimen composition, and enabling efficient analysis. The series continues to include the high-vacuum functionality and secondary electron detector, offering the ability to clearly observe fine structures on the specimen surface at high magnification.

Key Features

High performance system in a compact, innovative model

Intuitive touch panel operation with new GUI.

  • Well focused high-resolution morphological observation.
  • Secondary electron as well as backscattered electron imaging for compositional distribution.
  • Selectable accelerating voltages.
  • High and Low vacuum operation.
  • Full-featured Energy-dispersive X-ray Spectroscopy (EDS) with SDD technology (Optional).
  • Metrology supported.
  • Imaging of tilted, rotated samples (Optional).

Compact, light, and energy saving

Compact body equal to an optical microscope.

Base unit: 330mm (W) x 490mm (D) x 430mm (H); 50 kgUtility: Single phase 100 V to 240 V, 50/60 Hz, 700 to 960 VA

New capabilities for imaging

  • Secondary electron imaging and backscattered electron imaging supported at high vacuum
  • New high sensitivity solid state backscattered electron detector provides both composition and topographic imaging information
  • Dual frame imaging to facilitate comparison of live and retrieved images
  • A wide magnification range from 10x (for wide area of view) up to 60,000x.

Enhanced low vacuum capability

  • New solid state backscattered electron detector.
  • Easy observation of non conductive samples in the direct low vacuum mode.
  • Only 2 minutes 30 seconds from sample loading to imaging.

Simple operation

  • Easy touch panel operation.
  • A complete range of automated functions (auto focus, auto stigmator, auto contrast/brightness).
  • Easy, dependable auto gun alignment (filament centering).

Tilt/rotation motor drive holder

The tilt/rotation motor drive specimen holder allows the operator to tilt and rotate the sample for well focused 3D morphological observation.

Optional accessories

Energy dispersive X-ray spectrometer (EDS) for elemental analysis

  • Energy dispersive X-ray spectrometer (EDS) for elemental analysis.
  • JEOL's proprietary EDS.
  • Quick, reliable customer support guarantees satisfaction.

Note: This option is retrofittable